PHYS584 INTRODUCTION TO SCANNING PROBE MICROSCOPY (SPM)
| Course Code: |
2300584 |
| METU Credit (Theoretical-Laboratory hours/week): |
3(3-0) |
| ECTS Credit: |
8.0 |
| Department: |
Physics |
| Language of Instruction: |
English |
| Level of Study: |
Graduate |
| Course Coordinator: |
|
| Offered Semester: |
Fall and Spring Semesters. |
Course Content
Principles of tunneling phenomena & Scanning Tunneling Microscope (STM) Theory, scanning mechanisms: piezoelectric and coil, course approach, vibration isolation, data acquisition, feedback control: analog, digital, feed forward etc., Atomic Force Microscopy (AFM): theory, force detection methods in AFM, contact mode AFM, tapping mode AFM, non-contact mode operation of AFM & true atomic resolution, atomic manipulation, nanolithography, fast SPMs, SPM in liquids, operation in extreme environments, other SPM methods: MFM, SHPM, EFM, NSOM etc.
