PHYS584 INTRODUCTION TO SCANNING PROBE MICROSCOPY (SPM)
| Course Code: |
2300584 |
| METU Credit (Theoretical-Laboratory hours/week): |
3(3-0) |
| ECTS Credit: |
8.0 |
| Department: |
Physics |
| Language of Instruction: |
English |
| Level of Study: |
Graduate |
| Course Coordinator: |
Prof.Dr. ALPAN BEK |
| Offered Semester: |
Fall and Spring Semesters. |
Course Content
Principles of tunneling phenomena & Scanning Tunneling Microscope (STM) Theory. scanning mechanisms: piezoelectric and coil. course approach. vibration isolation. data acquisition. feedback control: analog. digital. feed forward etc.. Atomic Force Microscopy (AFM): theory. force detection methods in AFM. contact mode AFM. tapping mode AFM. non-contact mode operation of AFM & true atomic resolution. atomic manipulation. nanolithography. fast SPMs. SPM in liquids. operation in extreme environments. other SPM methods: MFM. SHPM. EFM. NSOM etc.
