METE508 CHARACTERIZATION OF MATERIALS
Course Content
Theory behind various material characterization techniques. Transmission electron microscopy (TEM). scanning electron miscroscopy (SEM). advanced X-ray diffraction (XRD) techniques. atomic force microscopy (AFM). Fourier-transform infrared spectroscopy (FTIR). ultraviolet/visible spectroscopy(UV/VIS). Raman spectroscopy. Differential thermal analysis (DTA). thermogravimetric analysis ( (TGA). differential scanning calorimetry (DSC). Dynamic light scattering (DLS). zeta potential analysis. Vibrating-sample magnetometer (VSM). Hall effect set-up.